Share Email Print

Proceedings Paper

A Description Of Scattering Of Light From A Rough Surface And Measurements Of The Surface Topography Of A Metal
Author(s): O Keller; P Sonderkaer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The scattering of light from a rough surface of a semi-infinite medium is analyzed by means of a Green's function formalism based on the macroscopic Maxwell equations. It is shown that every direction of scattering in the half-space above the surface, in the small roughness limit, is connected to precisely one spatial Fourier-component of the topography function. The possibilities for reconstructing the topography by ellipsometric measurements of the vectorial amplitude of the electric field scattered diffusely outside the specular direction are investigated. Using laser light having wavelengths of 458 nm or 514 nm, scattering measurements are performed on a polycrystalline AQ surface. Results are presented for experimental setups with two different angular resolutions.

Paper Details

Date Published: 23 March 1987
PDF: 10 pages
Proc. SPIE 0680, Surface Characterization and Testing, (23 March 1987); doi: 10.1117/12.939605
Show Author Affiliations
O Keller, University of Aalborg (Denmark)
P Sonderkaer, University of Aalborg (Denmark)

Published in SPIE Proceedings Vol. 0680:
Surface Characterization and Testing
Katherine Creath, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?