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Proceedings Paper

Normal Incidence Performance Of Multilayer Thin-Film Structures Containing A Magneto-Optical Film
Author(s): K Balasubramanian; H A Macleod
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Paper Abstract

Calculations of the reflectance, transmittance, Kerr magneto-optical polarization rotation, and related constants are important in the design of multilayer thin-film media for magneto-optical disks for data storage. Different computation methods have been suggested in the literature for specific structures.1-3 We have established a powerful technique based on matrix methods and have written a program to calculate all the optical responses of multilayer structures. Calculations for a few specific models have been made, and these predict Kerr rotation angles > 2° for normal incidence. These calculations can be readily extended to different media structures. Oblique incidence calculations are also being incorporated. We feel that disk media designs can be analyzed very effectively with this technique.

Paper Details

Date Published: 23 December 1986
PDF: 10 pages
Proc. SPIE 0678, Optical Thin Films II: New Developments, (23 December 1986); doi: 10.1117/12.939556
Show Author Affiliations
K Balasubramanian, University of Arizona (United States)
H A Macleod, University of Arizona (United States)

Published in SPIE Proceedings Vol. 0678:
Optical Thin Films II: New Developments
Richard Ian Seddon, Editor(s)

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