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Proceedings Paper

Determination Of Inherent Contrast Resolution In X-Ray Imaging Using Electron Density And Effective Atomic Number Differences
Author(s): Frank A. DiBianca; Joan E Fetter; Marion D Barker
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Paper Abstract

The problem of determining the inherent contrast resolution of an x-ray imaging device (CT or projection x-ray) has not thus far been satisfactorily solved. The contrast signal-to-noise ratio depends on the geometry and composition of the object being imaged, the x-ray beam spectrum and the detector spectral efficiency (signal) as well as a host of factors which contribute to the quantum and non-quantum statistical fluctuation in the image (noise). Because contrast depends on machine spectral factors as well as phantom atomic number differences, measurements made using any single low contrast phantom cannot yield the inherent contrast resolution but only the contrast resolution of the system for phantoms of that geometry and composition. We have overcome this problem by developing and using two phantoms to measure inherent contrast resolution: in one phantom the contrast-generating structures differ from the background material only in electron density, while in the second phantom the contrast is generated purely by a difference in effective atomic number of the materials. Measurements made using these phantoms allow the determination of the inherent contrast resolution of the device for objects of any composition. In this paper, descriptions of the construction and composition of the electron density and atomic number phantoms are given. Computer simulations and preliminary measurements of the inherent contrast resolution of clinical x-ray imaging systems are presented. From these, one can develop optimum methods of operating x-ray imaging devices.

Paper Details

Date Published: 15 June 1984
PDF: 8 pages
Proc. SPIE 0454, Application of Optical Instrumentation in Medicine XII, (15 June 1984); doi: 10.1117/12.939310
Show Author Affiliations
Frank A. DiBianca, University of North Carolina School of Medicine (United States)
Joan E Fetter, University of North Carolina School of Medicine (United States)
Marion D Barker, University of North Carolina School of Medicine (United States)

Published in SPIE Proceedings Vol. 0454:
Application of Optical Instrumentation in Medicine XII
Samuel J. Dwyer III; Roger H. Schneider, Editor(s)

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