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Proceedings Paper

A New Method Of Surface Roughness Measurement Using Far Field Speckle
Author(s): Liu Rong-ping; Liu Pei-sen
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Paper Abstract

In this paper, an expression which relates the normalized ensemble average of central peak intensity in the far field speckle pattern to the variance and correlation length of a rough surface under measurement is derived theoretically. On this basis, a new method of measuring surface roughness is suggested, and computer simulation experiment is conducted. The results obtained are in good agreement with the theoretical analysis.

Paper Details

Date Published: 15 January 1988
PDF: 5 pages
Proc. SPIE 0673, Holography Applications, (15 January 1988); doi: 10.1117/12.939092
Show Author Affiliations
Liu Rong-ping, Beijing Institute of Technology (China)
Liu Pei-sen, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 0673:
Holography Applications
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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