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Proceedings Paper

Design And Characterization Of Graded Reflectivity Mirrors
Author(s): Nathalie McCarthy; Pierre Lavigne; J.-G. Demers; Andre Parent
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Paper Abstract

A new design of graded reflectivity mirrors is presented. It consists in depositing an appropriately shaped thin layer of a high-refractive-index dielectric on a transparent substrate. The technique used to deposit the profiled layer is discussed. Mirrors with Gaussian reflectivity profiles have been fabricated for use at 10.6 and 3.7 μm. An interferometer which has been setup to characterize the distortions of the reflected and transmitted wave fronts of one of the 10-μm prototypes is described and the results are presented.

Paper Details

Date Published: 25 November 1986
PDF: 7 pages
Proc. SPIE 0661, Optical Testing and Metrology, (25 November 1986); doi: 10.1117/12.938639
Show Author Affiliations
Nathalie McCarthy, Universite du Quebec (Canada)
Pierre Lavigne, Universite du Quebec (Canada)
J.-G. Demers, Universite du Quebec (Canada)
Andre Parent, Universite du Quebec (Canada)

Published in SPIE Proceedings Vol. 0661:
Optical Testing and Metrology
Chander Prakash Grover, Editor(s)

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