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Proceedings Paper

Single Figure Merit Function For AR-Coatings In Electro-Optical Systems
Author(s): Konrad A Roider; Peter Ganner
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Paper Abstract

Merit functions are derived for non-imaging and imaging systems. In non-imaging (energy-collecting) systems it is essential to maximize the output signal of the detector, which leads to the well established criterion of maximizing system throughput. Imaging systems, on the other hand, require maximizing the spatial signal-to-background ratio. The merit function derived from this criterion is suitable for assessing different coating designs relating to their effectiveness in electro-optical systems.

Paper Details

Date Published: 31 October 1986
PDF: 3 pages
Proc. SPIE 0655, Optical System Design, Analysis, Production for Advanced Technology Systems, (31 October 1986); doi: 10.1117/12.938428
Show Author Affiliations
Konrad A Roider, D. Swarovski & Co (Austria)
Peter Ganner, D. Swarovski & Co (Austria)

Published in SPIE Proceedings Vol. 0655:
Optical System Design, Analysis, Production for Advanced Technology Systems
Robert E. Fischer; Philip J. Rogers, Editor(s)

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