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Proceedings Paper

Coherence Loss Due To Thin Film Interface Roughness
Author(s): W H. Southwell
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Paper Abstract

Using a surface roughness model consisting of narrow columns of differing heights, the spectral transmittance and front and backside reflectance have been derived for a single layer on a smooth substrate. The effects of various amounts of surface roughness have been compared to various amounts of layer absorption. Surface roughness causes a more rapid loss of modulation with wavelength in transmission than absorption. It begins to act like incoherent light, which shows no wavelength fringing.

Paper Details

Date Published: 13 October 1986
PDF: 7 pages
Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); doi: 10.1117/12.938393
Show Author Affiliations
W H. Southwell, Rockwell International Science Center (United States)

Published in SPIE Proceedings Vol. 0652:
Thin Film Technologies II
J. Roland Jacobsson, Editor(s)

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