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Proceedings Paper

Real-Time High Accuracy Measurements Utilizing Line-Scan Image Sensors
Author(s): D J Moreland; C A Hobson; M J Lalor; D B Clegg
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Paper Abstract

Real-time, non-contact, high accuracy measurements of small components are realised utilizing diffraction pattern theory. High speed line-scan CCD (charge coupled device) sensors, coupled with a microcomputer system with specalised hardware, allow the implementation of least squares and transform algorithms for the analysis of diffraction pattern data.

Paper Details

Date Published: 17 November 1986
PDF: 9 pages
Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938264
Show Author Affiliations
D J Moreland, Liverpool Polytechnic (United Kingdom)
C A Hobson, Liverpool Polytechnic (United Kingdom)
M J Lalor, Liverpool Polytechnic (United Kingdom)
D B Clegg, Liverpool Polytechnic (United Kingdom)

Published in SPIE Proceedings Vol. 0654:
Automatic Optical Inspection
Lionel R. Baker; H. John Caulfield, Editor(s)

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