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Proceedings Paper

Automatic Measurement Of Refractive Index Profile Of Slab Waveguides By Interference Fringe Processing
Author(s): B. Hillerich; E. Weidel; D. Gruchmann
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Paper Abstract

Details of index profile measurement of slab waveguides by transverse interferometry using video image processing of the interference fringe pattern are discussed. Resolution limits, data processing and sample preparation are described. Some examples of ion exchanged glass waveguides are given.

Paper Details

Date Published: 3 November 1986
PDF: 7 pages
Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); doi: 10.1117/12.938159
Show Author Affiliations
B. Hillerich, AEG Aktiengesellschaft (Germany)
E. Weidel, AEG Aktiengesellschaft (Germany)
D. Gruchmann, AEG Aktiengesellschaft (Germany)

Published in SPIE Proceedings Vol. 0651:
Integrated Optical Circuit Engineering III
Ralf Th. Kersten, Editor(s)

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