Share Email Print

Proceedings Paper

Surface processing of CdZnTe crystals
Author(s): V. A. Gnatyuk; O. I. Vlasenko; S. N. Levytskyi; E. Dieguez; J. Crocco; H. Bensalah; M. Fiederle; A. Fauler; T. Aoki
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The Cd1-xZnxTe (x = 0.1) crystals from two different manufacturers were studied by photoconductivity (PC) measurements. The samples 1 and 2 were subjected to chemical etching and irradiation with nanosecond laser pulses. The IR transmittance spectra of the crystals before and after laser irradiation were also monitored. The PC spectrum of the sample 1 had a typical one-band shape while the spectrum of the sample 2 exhibited two bands roughly corresponding to the bandgaps of CdTe and Cd1-xZnxTe that could be attributed to inhomogeneities in the surface region of the crystal. The positions of the maximum and red edge of the PC spectra did not correspond to the component compositions x in the bulk of Cd0.9Zn0.1Te crystals, however chemical polishing etching of the samples in a brominemethanol solution or/and laser irradiation led to this correspondence. Moreover, depending of laser pulse energy density, irradiation of Cd1-xZnxTe crystals resulted in a short-wavelength shift of the PC spectra, transformation of two bands to one in the case of the sample 2, and an increase in the photosensitivity of the semiconductor. The laser processing provided equalization of parameters in the surface and bulk regions.

Paper Details

Date Published: 24 October 2012
PDF: 5 pages
Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85071S (24 October 2012); doi: 10.1117/12.937953
Show Author Affiliations
V. A. Gnatyuk, V. E. Lashkaryov Institute of Semiconductor Physics (Ukraine)
Shizuoka Univ. (Japan)
O. I. Vlasenko, V. E. Lashkaryov Institute of Semiconductor Physics (Ukraine)
S. N. Levytskyi, V. E. Lashkaryov Institute of Semiconductor Physics (Ukraine)
E. Dieguez, Univ. Autónoma de Madrid (Spain)
J. Crocco, Univ. Autónoma de Madrid (Spain)
H. Bensalah, Univ. Autónoma de Madrid (Spain)
M. Fiederle, Freiburger Materialforschungszentrum (Germany)
A. Fauler, Freiburger Materialforschungszentrum (Germany)
T. Aoki, Shizuoka Univ. (Japan)

Published in SPIE Proceedings Vol. 8507:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV
Ralph B. James; Arnold Burger; Larry A. Franks; Michael Fiederle, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?