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Proceedings Paper

High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene
Author(s): Max Loewenstein; James R Podolske; Prasad Varanasi
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Paper Abstract

A diode-laser spectrometer was used to measure individual R-branch line strengths in the (v4 + v5)° combination band of C2H2. A total band strength of Sv = 63 ±2 cm-1/cm atm was found for the normal isotopic composition of C2H2. Broadening parameters for several R-branch lines were determined with N2 and He as the broadening gases.

Paper Details

Date Published: 26 November 1983
PDF: 4 pages
Proc. SPIE 0438, Tunable Diode Laser Development and Spectroscopy Applications, (26 November 1983); doi: 10.1117/12.937461
Show Author Affiliations
Max Loewenstein, NASA Ames Research Center (United States)
James R Podolske, NASA Ames Research Center (United States)
Prasad Varanasi, State U. of New York (United States)

Published in SPIE Proceedings Vol. 0438:
Tunable Diode Laser Development and Spectroscopy Applications
Chiwoei Wayne Lo, Editor(s)

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