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Proceedings Paper

Common Path Shearing Fringe Scanning Interferometer
Author(s): Xiaoming Ren; Yao Gang; Jingtang Ke
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Paper Abstract

A plate shearing interferometer can be used for measurement of the optical aspherical surfaces. Being common path this kind of interferometer is quite stable. The use of a plate shearing interferometer for fringe scanning interferometry is discussed. The phase shifting is provided by a new technique presented in this paper. It is shown theoretically and experimentally that this technique can be used for real time wavefront-aberration detection with greater pricision.

Paper Details

Date Published: 28 October 1987
PDF: 4 pages
Proc. SPIE 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review, (28 October 1987);
Show Author Affiliations
Xiaoming Ren, Jiangsi Academy of Sciences (China)
Yao Gang, Zhengzhou Institute of Technology (China)
Jingtang Ke, Zhengzhou Institute of Technology (China)


Published in SPIE Proceedings Vol. 0699:
Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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