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Proceedings Paper

Optoelectronic Techniques For Measurement And Inspection
Author(s): Lionel R. Baker
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Paper Abstract

The advantages of using optoelectronic techniques and the problems which need to be overcome when applying them in the field of measurement and inspection are reviewed. After a brief description of the basic methods and principles employed, typical systems recently developed at Sira using lasers, white light and infrared radiation for the inspection of large areas, microscopic defects and stress patterns are described to illustrate the range of new methods now available for use by industry.

Paper Details

Date Published: 28 October 1987
PDF: 7 pages
Proc. SPIE 0699, Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review, (28 October 1987); doi: 10.1117/12.936906
Show Author Affiliations
Lionel R. Baker, Sira Ltd (United Kingdom)

Published in SPIE Proceedings Vol. 0699:
Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review
Jingtang Ke; Ryszard J. Pryputniewicz, Editor(s)

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