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Proceedings Paper

An Undulator Based Scanning Microscope At The National Synchrotron Light Source
Author(s): H. Rarback; D. Shu; H. Ade; C. Jacobsen; J. Kirzi; I. McNulty; R. Rosser
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Paper Abstract

A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility.

Paper Details

Date Published: 12 August 1986
PDF: 4 pages
Proc. SPIE 0691, X-Ray Imaging II, (12 August 1986); doi: 10.1117/12.936628
Show Author Affiliations
H. Rarback, National Synchrotron Light Source, Brookhaven National Laboratory (United States)
D. Shu, National Synchrotron Light Source, Brookhaven National Laboratory (United States)
H. Ade, SUNY (United States)
C. Jacobsen, SUNY (United States)
J. Kirzi, SUNY (United States)
I. McNulty, SUNY (United States)
R. Rosser, SUNY (United States)

Published in SPIE Proceedings Vol. 0691:
X-Ray Imaging II
D. Keith Bowen; Larry V. Knight, Editor(s)

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