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Proceedings Paper

Los Alamos X-Ray Characterization Facilities For Plasma Diagnostics
Author(s): Robert H. Day; Richard L. Blake; Gary L. Stradling; Walter J. Trela; Roger J. Bartlett
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Paper Abstract

A summary is given of characteristics of x-ray sources used by Los Alamos National Laboratory to calibrate various x-ray diagnostic packages and components. Included are D.C. sources in electron impact and fluorescence modes, a pulsed laser source for soft x rays with 100 ps time resolution, Febetron pulsed electron impact sources, and both EUV and x-ray synchrotron beamlines.

Paper Details

Date Published: 12 August 1986
PDF: 10 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936583
Show Author Affiliations
Robert H. Day, Los Alamos National Laboratory (United States)
Richard L. Blake, Los Alamos National Laboratory (United States)
Gary L. Stradling, Los Alamos National Laboratory (United States)
Walter J. Trela, Los Alamos National Laboratory (United States)
Roger J. Bartlett, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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