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Proceedings Paper

Soft X-Ray Calibration of Diffracting Materials
Author(s): P. G. Burkhalter; J. V. Gilfrich; D. B. Brown; D. L. Rosen
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Paper Abstract

X-ray spectral analysis plays a major role as a diagnostic for hot, dense plasmas. Various diffraction media are utilized as flat or convex-curved surfaces for collecting soft x-ray spectral data in the 200 eV - 2 keV energy range. Calibration of the diffracting surface provides means for absolute line emission measurements from plasma generating sources i.e., pulsed-discharge gas puff and focused laser-target interaction experiments. The purpose of this work is the evaluation and absolute intensity calibration of diffraction surfaces consisting of grown crystals (acid phthalate), naturally occurring crystals (beryl) and surfaces formed by vacuum deposition (multilayered structures). The sources and experimental equipment used for the calibration work were: 1) a conventional sealed x-ray tube, x-ray fluorescer, and a single-crystal spectrometer, 2) a soft x-ray facilities incorporating a Henke tube with demountable anodes and double-crystal spectrometer.

Paper Details

Date Published: 12 August 1986
PDF: 7 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936574
Show Author Affiliations
P. G. Burkhalter, Naval Research Laboratory (United States)
J. V. Gilfrich, Naval Research Laboratory (United States)
D. B. Brown, Naval Research Laboratory (United States)
D. L. Rosen, Sachs/Freeman Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

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