Share Email Print
cover

Proceedings Paper

Techniques Of Absolute Low Energy X-Ray Calibration
Author(s): Robert H. Day
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Recent advances in pulsed plasma research, materials science, and astrophysics have required many new diagnostic instruments for use in the low energy x-ray regime. The characterization of these instruments has provided a challenge to instrument designers and provided the momentum to improve x-ray sources and dosimetry techniques. In this paper, the present state-of-the-art in low energy x-ray characterization techniques is reviewed. A summary is given of low energy x-ray generator technology and dosimetry techniques including a discussion of thin window proportional counters and ionization chambers. A review is included of the widely used x-ray data bases and a sample of ultra-soft x-ray measuring techniques is discussed. These techniques include sub-femtoampere current measuring procedures, chopped x-ray source generators, phase sensitive detection of ultralow currents, and angular divergence measurements.

Paper Details

Date Published: 12 August 1986
PDF: 8 pages
Proc. SPIE 0689, X-Ray Calibration: Techniques, Sources, and Detectors, (12 August 1986); doi: 10.1117/12.936570
Show Author Affiliations
Robert H. Day, Los Alamos National Laboratory (United States)


Published in SPIE Proceedings Vol. 0689:
X-Ray Calibration: Techniques, Sources, and Detectors
Ping Lee; Paul D. Rockett, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray