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Proceedings Paper

Design And Performance Of Blocked-Impurity-Band Detector Focal Plane Arrays
Author(s): S. B. Stetson; D. B. Reynolds; M. G. Stapelbroek; R. L. Stermer
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Paper Abstract

Blocked-Impurity-Band (BIB) extrinsic silicon (Si:As) detectors have demonstrated high sensitivity and quantum efficiency in the long wavelength infrared (LWIR) spectral region (to 28 microns) as well as wide frequency response, low optical crosstalk, nuclear radiation hardness, and stable, predictable performance. Furthermore, it has been demonstrated that SWItched mosFET (SWIFET) multiplexers provide a low noise readout approach for use with BIB detectors. This paper describes the state-of-the-art of multiplexed BIB detector hybrid focal plane arrays (HFPAs). The principle of operation and performance of optimized BIB and Back Illuminated BIB (BIBIB) detectors are presented. The SWIFET multiplexer, including necessary circuitry for BIBIB detector readout, has been designed and fabricated using a newly developed process for cryogenic (<20K) MOS electronics which avoids anomalies (lack of device isolation, excess noise, and long time constants) associated with conventional silicon processes. A description of the design and operation of this multiplexer is given. A number of uniform, highly responsive, 500 element HFPAs have been fabricated and their performance evaluated. The characterization measurements, to be described in the paper, include evaluation of detector dark current, responsivity, noise for various operating conditions, and uniformity of array characteristics. The results obtained and presented demonstrate that focal plane arrays with excellent, unprecedented, LWIR performance have been realized with Blocked-Impurity-Band detector technology.

Paper Details

Date Published: 6 November 1986
PDF: 18 pages
Proc. SPIE 0686, Infrared Detectors, Sensors, and Focal Plane Arrays, (6 November 1986); doi: 10.1117/12.936525
Show Author Affiliations
S. B. Stetson, Rockwell International Corporation (United States)
D. B. Reynolds, Rockwell International Corporation (United States)
M. G. Stapelbroek, Rockwell International Corporation (United States)
R. L. Stermer, Rockwell International Corporation (United States)

Published in SPIE Proceedings Vol. 0686:
Infrared Detectors, Sensors, and Focal Plane Arrays
Hideyoshi Nakamura, Editor(s)

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