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Proceedings Paper

A Frequency Domain Description Of Interferogram Analysis
Author(s): Kenneth H. Womack
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Paper Abstract

Interferogram analysis is discussed as a sampling problem using the concepts of Fourier analysis. The relative merits of random, raster, and uniform sampling of a wavefront are examined. A relationship between a global least squares fit and interpolation in the spatial domain and transfer functions in the frequency domain is described.

Paper Details

Date Published: 15 November 1983
PDF: 8 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936356
Show Author Affiliations
Kenneth H. Womack, Eastman Kodak Company (United States)

Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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