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Proceedings Paper

AC Phase Measurement Technique For Moire Interferograms
Author(s): R. N. Shagam
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Paper Abstract

This paper describes a method by which recorded moire interferograms of diffuse, non optical surfaces may be processed using the principle of optical phase measurement by AC interferometry. In this method, a moire interferogram is recorded and processed as a transparency. The resulting interferogram is equivalent to a low spatial frequency optical hologram. An optical wavefront whose phase variations can be reconstructed from a plane wavefront and interfered with a second coherent plane wavefront of slightly different optical frequency, resulting in an interferogram appropriate for measurement by temporal electronic phase measurement. The results compare favorably to direct contact measurements.

Paper Details

Date Published: 15 November 1983
PDF: 8 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936338
Show Author Affiliations
R. N. Shagam, Air Force Weapons Laboratory (United States)

Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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