Share Email Print
cover

Proceedings Paper

Panel Discussion "Radiometric Standards For Industry"
Author(s): Clair L. Wyatt; Jon Geist; Stephan L. Carman; Clyde A. Randolph; Isaac Richman; Bruce C. Steakley; Herbert Little
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Note to the Readers: The moderator (Clair L. Wyatt) has edited the verbatim transcripts of the Panel Discussion to remove the most obvious ambiguities and repetitions without altering the general conversational tone of each panelist's comments. The Panel Discussion was recorded using magnetic audio tape cassettes. Recording failures occurred during the audience question period and that portion had to be omitted from this document.

Paper Details

Date Published: 22 September 1983
PDF: 9 pages
Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); doi: 10.1117/12.935930
Show Author Affiliations
Clair L. Wyatt, Utah State University (United States)
Jon Geist, National Bureau of Standards (United States)
Stephan L. Carman, TRW Space and Technology Group (United States)
Clyde A. Randolph, Rockwell International (United States)
Isaac Richman, McDonnell Douglas Astronautics Co. (United States)
Bruce C. Steakley, Lockheed Missiles and Space Co. (United States)
Herbert Little, Calspan Field Services, Inc. (United States)


Published in SPIE Proceedings Vol. 0416:
Applications of Optical Metrology: Techniques and Measurements II
Jar Jueh Lee, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray