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Proceedings Paper

Strain Of Metal Surfaces Determined By Optical Ellipsometry
Author(s): O. Keller; K. Pedersen
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Paper Abstract

ℓThe state of polarization of light reflected from a strained metal surface is analyzed. It is demonstrated that the reflected light contains contributions which are linear and quadratic functions of strain. As shown, by our measurements on polycrystalline Aℓ, these can be separated by ellipsometry. The reflected light is measured as a function of the orientation of the principal axes of strain and qualitative agreement with theoretical predictions is obtained.

Paper Details

Date Published: 28 November 1983
PDF: 9 pages
Proc. SPIE 0401, Thin Film Technologies I, (28 November 1983); doi: 10.1117/12.935503
Show Author Affiliations
O. Keller, University of Aalborg (Denmark)
K. Pedersen, University of Aalborg (Denmark)

Published in SPIE Proceedings Vol. 0401:
Thin Film Technologies I
J. Roland Jacobsson, Editor(s)

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