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Proceedings Paper

Fault Detection In Non-Destructive Testing (NDT) By An Opto-Electronic Hybrid Processor
Author(s): Helmut Glunder; Reimar Lenz
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Paper Abstract

An opto-digital interferogram evaluation system for quality control applications is presented. The system allows the recognition of certain predefined fringe configurations in the input data. Thus the processor is well suited to detect defects of an interferometrically recorded object.

Paper Details

Date Published: 13 December 1983
PDF: 6 pages
Proc. SPIE 0370, Holographic Data Nondestructive Testing, (13 December 1983); doi: 10.1117/12.934896
Show Author Affiliations
Helmut Glunder, Techn.Universitat Munchen (FRG)
Reimar Lenz, Techn. Universitat Munchen (FRG)

Published in SPIE Proceedings Vol. 0370:
Holographic Data Nondestructive Testing
Dalibor Vukicevic, Editor(s)

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