Proceedings Paper
The Practical Application Of Holographic Interferometry| Format | Member Price | Non-Member Price |
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Paper Abstract
In the course of the last two decades holographic interferometry has developed into a branch of metrology which has become essential for production metrology and quality control in the optical industry. Two techniques are particularly important: holographic real-time interferometry using either photographic methods or computer holograms. Examples are given.
Paper Details
Date Published: 10 November 1983
PDF: 5 pages
Proc. SPIE 0381, Optical Surface Technology, (10 November 1983); doi: 10.1117/12.934858
Published in SPIE Proceedings Vol. 0381:
Optical Surface Technology
Hermann Walter, Editor(s)
PDF: 5 pages
Proc. SPIE 0381, Optical Surface Technology, (10 November 1983); doi: 10.1117/12.934858
Show Author Affiliations
Reimund Torge, Carl Zeiss (West-Germany)
Published in SPIE Proceedings Vol. 0381:
Optical Surface Technology
Hermann Walter, Editor(s)
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