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Proceedings Paper

Analysis Of Laser Desorption By Secondary Ion Mass Spectrometry
Author(s): Alan R. Burns
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Paper Abstract

For the first time, laser-induced thermal desorption is examined with secondary ion mass spectrometry (SIMS). The desorption of small molecules on a polycrystalline tungsten surface by high-intensity (up to 176 MW/cm2), 1064-nm pulses of 8-10 nsec duration is analyzed by monitoring relative changes in the SIMS intensities. Despite the very high surface temperatures (3000 K) obtained by the absorption of intense laser radiation, the observed changes are much smaller than predicted by the equilibrium model of thermal desorption.

Paper Details

Date Published: 7 November 1983
PDF: 8 pages
Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983); doi: 10.1117/12.934770
Show Author Affiliations
Alan R. Burns, Sandia National Laboratories (United States)

Published in SPIE Proceedings Vol. 0380:
Los Alamos Conf on Optics '83
Robert S. McDowell; Susanne C. Stotlar, Editor(s)

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