Share Email Print

Proceedings Paper

New Analysis Methods In Photon Correlation Spectroscopy
Author(s): P. J. Nash; T. A. King
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper describes the analysis of photon correlation spectroscopy decay curves by a significant new method based on the fitting of sums of positive exponentials by the S-exponential sum fitting method. The method fits a positive exponential sum to a given data set providing a best weighted least squares fit. No initial setting of any of the parameters is required and the number of exponential coefficients does not have to be preset in the program but is determined by the number of components apparent above the noise level. Results will be discussed for application in scattering systems which may be single or multiple component. Systems generating single, double or multiple exponential decay functions derived from computer simulation or photon correlation exneriments are considered and fitting analysis with varying noise levels.

Paper Details

Date Published: 16 June 1983
PDF: 10 pages
Proc. SPIE 0369, Max Born Centenary Conf, (16 June 1983); doi: 10.1117/12.934433
Show Author Affiliations
P. J. Nash, University of Manchester (United Kingdom)
T. A. King, University of Manchester (United Kingdom)

Published in SPIE Proceedings Vol. 0369:
Max Born Centenary Conf
M. John Colles; D. William Swift, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?