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Proceedings Paper

Analytical Capabilities Of Transmission Electron Microscope (TEM) Systems
Author(s): P. Hagemann; M. N. Thompson
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Paper Abstract

The paper lists the principle sources of information in electron microscopy which become available due to the electron specimen interaction. It further describes the main electron optical and detector components and indicates how special operation modes of a transmission electron microscope based analytical system are obtained. Finally some of the possible applications are demonstrated on stainless steel and palladium catalyst specimens.

Paper Details

Date Published: 29 March 1983
PDF: 6 pages
Proc. SPIE 0368, Microscopy: Techniques and Capabilities, (29 March 1983); doi: 10.1117/12.934321
Show Author Affiliations
P. Hagemann, Electron Optics Applications Laboratory (The Netherlands)
M. N. Thompson, Electron Optics Applications Laboratory (The Netherlands)

Published in SPIE Proceedings Vol. 0368:
Microscopy: Techniques and Capabilities
Lionel R. Baker, Editor(s)

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