Share Email Print

Proceedings Paper

High Precision Scanning Interferometer For Assessment Of Infrared Systems
Author(s): D. R.J. Campbell
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Pilkington P. E. were asked to develop a 300 mm. aperture, high-precision scanning interferometer with associated software for the semi-automatic testing of far infrared lenses and systems. The instrument as developed is capable of analysing and evaluating systems in terms of OTF, PSF, wavefront aberration, ray intersection patterns, polynomial fitting, aberration contouring, refractive index variation mapping and of providing a large range of representations of data. The speed of the analysis is commensurate with established techniques with an improvement in the accuracy and flexibility of use of the instrument over alternative measuring systems. Results from the developed system will be presented to show the effectiveness of the instrument.

Paper Details

Date Published: 27 May 1982
PDF: 7 pages
Proc. SPIE 0330, Optical Systems Engineering II, (27 May 1982); doi: 10.1117/12.934259
Show Author Affiliations
D. R.J. Campbell, Pilkington P. E. (United Kingdom)

Published in SPIE Proceedings Vol. 0330:
Optical Systems Engineering II
Paul R. Yoder Jr., Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?