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Proceedings Paper

Positional Repeatability Measurements Of Stepper Motors At Cryogenic Temperatures
Author(s): Stephen M. Pompea; Michael S. Hall; Frank Bartko; James R. Houck
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Paper Abstract

Stepper motors operating at liquid helium temperature have multiple applications in cryogenically-cooled telescopes such as the Shuttle Infrared Telescope Facility (SIRTF). These SIRTF applications include driving cryogen flow valves, operating the Multiple Instrument Chamber (MIC) beam splitter mechanism, and operating filters and grating wheel mechanisms in the scientific instruments. The positional repeatability of the beam splitter drive mechanism is especially critical since it feeds the optical beam to the scien-tific instruments. Despite these important applications, no significant data on the positional repeatability of stepper motors at cryogenic temperatures has been available. Therefore, we conducted a series of measurements to determine the positional repeatability of a modified, off-the-shelf Berger/Lahr stepper motor (model RDM 253/25, step angle 3.6°) which had demonstrated excellent performance in previous endurance testing at LHe temperature. These test results indicated that the positional repeatability of the motor was excellent at all temperatures, with somewhat better performance at cryogenic temperatures. Another important result was that the motor could be repeatedly turned off and on while still accurately retaining its rotor position.

Paper Details

Date Published: 16 August 1983
PDF: 7 pages
Proc. SPIE 0364, Technologies of Cryogenically Cooled Sensors and Fourier Transform Spectrometers II, (16 August 1983); doi: 10.1117/12.934193
Show Author Affiliations
Stephen M. Pompea, Martin Marietta Aerospace (United States)
Michael S. Hall, Martin Marietta Aerospace (United States)
Colorado State University (United States)
Frank Bartko, Martin Marietta Aerospace (United States)
James R. Houck, Cornell University (United States)

Published in SPIE Proceedings Vol. 0364:
Technologies of Cryogenically Cooled Sensors and Fourier Transform Spectrometers II
Ronald J. Huppi, Editor(s)

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