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Proceedings Paper

High Temperature Millimeter Wave Dielectric Characterization Of Radome Materials
Author(s): W. W. Ho
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Paper Abstract

Experimental methods have been developed to determine the millimeter wave dielectric properties of materials at temperatures up to 1600°C. Accuracies of the order of ±1.5% for dielectric constant measurements and ±5% with a detection limit of ±0.0001 for loss tangent measurement over the entire temperature range have been demonstrated.

Paper Details

Date Published: 5 April 1983
PDF: 6 pages
Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); doi: 10.1117/12.934151
Show Author Affiliations
W. W. Ho, Rockwell International Science Center (United States)

Published in SPIE Proceedings Vol. 0362:
Scattering in Optical Materials II
Solomon Musikant, Editor(s)

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