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Proceedings Paper

Proposed Figures Of Merit For Staring Focal Planes
Author(s): W. B. Birtley
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Paper Abstract

This work reflects the methodology used at Rockwell International in the radiometric evaluation of IR/CCD focal plane elements. It is intended as an input which, when combined with inputs from other industrial and government groups, will result in standardized procedures for the evaluation of detector/charge-coupled devices similar to the procedures prepared by DOD for the evaluation of infrared detectors. Specifically, data collection, data reduction, and data formats are discussed, as well as proposed figures of merit for quantum yield and device noise.

Paper Details

Date Published: 28 December 1982
PDF: 6 pages
Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); doi: 10.1117/12.933749
Show Author Affiliations
W. B. Birtley, Rockwell International Corporation (United States)

Published in SPIE Proceedings Vol. 0344:
Infrared Sensor Technology
Reinhard D. Ennulat, Editor(s)

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