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Proceedings Paper

Automatic Test System For Infrared Detector And Charge-Coupled Device (CCD) Multiplexer Control And Data Acquisition
Author(s): Charles Chandler
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Paper Abstract

Automatic test of IR detectors and CCD devices is accomplished by connecting programmable test equipment to a minicomputer. Digital signals from a timing generator are converted to analog levels and applied to the CCD. Video output from the CCD is digitized and transferred via a buffer memory into the computer for analysis. The device temperature, IR irradiance level and applied voltages are variable under program control. Measured device parameters are printed on paper and saved in machine-readable form as data base files. The device under test can be a packaged die mounted in a dewar or be in wafer form on the wafer prober.

Paper Details

Date Published: 28 December 1982
PDF: 8 pages
Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); doi: 10.1117/12.933747
Show Author Affiliations
Charles Chandler, Ford Aerospace & Communications Corporation (United States)

Published in SPIE Proceedings Vol. 0344:
Infrared Sensor Technology
Reinhard D. Ennulat, Editor(s)

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