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Proceedings Paper

Drift Scan Observations With A Charge-Coupled Device (CCD)
Author(s): Craig D. Mackay
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Paper Abstract

A new procedure has been developed of using a Charge-Coupled Device (CCD) that entirely eliminates the need for flat field calibration exposures and therefore avoids the limitations inherent in conventional flat fielding methods. This paper describes the procedure, its advantages and disadvantages and the data processing steps that are needed. Examples of images at various stages are given as are the first results of background galaxy counts to an equivalent J magnitude of about 25m6.

Paper Details

Date Published: 16 November 1982
PDF: 5 pages
Proc. SPIE 0331, Instrumentation in Astronomy IV, (16 November 1982); doi: 10.1117/12.933449
Show Author Affiliations
Craig D. Mackay, University of Cambridge (United Kingdom)

Published in SPIE Proceedings Vol. 0331:
Instrumentation in Astronomy IV
David L. Crawford, Editor(s)

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