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Proceedings Paper

Utilization Of SYSCAP II Circuit Analysis Program For Electro-Optical Circuit Design
Author(s): C. T. Kleiner
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Paper Abstract

The successful development of various electro-optical systems is highly dependent on precise electronic circuit design which must account for possible parameter drift in the various piece-parts. The utilization of a comprehensive computer analysis program (SYSCAP II) provides the electro-optical system designer and electro-optical management with a well-structured tool for a comprehensive circuit analysis. An overview of the SYSCAP II program is being presented with examples applicable to electro-optical design problems. In particular, the program has been used for extensive radiation effects predictions of semi-conductor response to various transient and permanent radiation effects. Worst-case, Monte Carlo, and component failure simulation (CFS) are discussed with respect to the electro-optical design challenges for the 1980s, including "design for producibility". The SYSCAP II program is provided through Control Data Corporation (CDC) with Rockwell International providing the technology under a licensing arrangement with Control Data Corporation. As a result, the techniques described in this paper can be readily used by the electro-optical design community.

Paper Details

Date Published: 30 June 1982
PDF: 6 pages
Proc. SPIE 0327, Sensor Design Using Computer Tools, (30 June 1982); doi: 10.1117/12.933363
Show Author Affiliations
C. T. Kleiner, Rockwell International Corporation (United States)


Published in SPIE Proceedings Vol. 0327:
Sensor Design Using Computer Tools
John A. Jamieson, Editor(s)

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