Share Email Print

Proceedings Paper

Simulation Tool Supporting The Development Of Sensor Signal Processing
Author(s): D. C. Hofmeister
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper discusses a simulation tool and its application to the definition and development of several critical signal processing algorithms. These algorithms are used in conjunction with a sensor to provide for the detection and resolution of a target complex consisting of several thousand objects. This detection and resolution problem is complicated by the fact that many of these objects are contained in high density clusters that occupy less than a single square degree of the sensor's field of view. It was found that the detailed development of these signal processing algorithms, as well as downstream data processing algorithms, depended heavily upon the implementation and use of high-fidelity sensor and threat scenario models. These models provide the capability of generating accurate detector voltage trains representative of both simple and complex scenarios in support of algorithm concept evaluations. Significant sensor characteristics that are modeled include: (1) the focal plane geometry, (2) detector waveshape (responsivity effects), (3) signal conditioning electronics effects, and (4) sensor-associated anomalies. The threat model includes the significant metric and radiometric characteristics of the objects complex as viewed by the sensor. The partial evolution of one key signal processing algorithm--closely spaced object resolution--is traced as a means of illustrating the utility of the simulation as an algorithm development testbed.

Paper Details

Date Published: 30 June 1982
PDF: 10 pages
Proc. SPIE 0327, Sensor Design Using Computer Tools, (30 June 1982); doi: 10.1117/12.933349
Show Author Affiliations
D. C. Hofmeister, McDonnell Douglas Astronautics Company (United States)

Published in SPIE Proceedings Vol. 0327:
Sensor Design Using Computer Tools
John A. Jamieson, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?