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Proceedings Paper

Spectral Emittance Measurements Of Thin Films
Author(s): Donald L. Stierwalt
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Paper Abstract

Infrared spectral emittance measurements can be used to determine the optical characteristics of thin films. The method is discussed and some examples are presented.

Paper Details

Date Published: 29 April 1982
PDF: 4 pages
Proc. SPIE 0325, Optical Thin Films, (29 April 1982); doi: 10.1117/12.933300
Show Author Affiliations
Donald L. Stierwalt, Naval Ocean Systems Center (United States)

Published in SPIE Proceedings Vol. 0325:
Optical Thin Films
Richard Ian Seddon, Editor(s)

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