Share Email Print

Proceedings Paper

Root cause determination of on-orbit degradation of the VIIRS rotating telescope assembly
Author(s): J. D. Barrie; P. D. Fuqua; M. J. Meshishnek; M. R. Ciofalo; C. T. Chu; J. A. Chaney; R. M. Moision; L. Graziani
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The Visible Infrared Imaging Radiometer Suite (VIIRS) is a sensor onboard the recently launched Suomi NPP spacecraft. Shortly after launch, VIIRS was found to exhibit a pronounced decrease in the optical throughput of several bands, with the near-infrared bands being more affected than those in the visible. The anomaly investigation team performed several experiments that concluded the primary source of degradation was throughput loss in the VIIRS rotating telescope assembly, likely caused by ultraviolet light illumination. This paper will discuss the laboratory investigation that determined the root cause of the telescope degradation to be UV photo-darkening of a tungsten oxide contaminant film that had been inadvertently deposited during the mirror manufacturing process. We will present data from experiments conducted on witness mirrors manufactured along with the telescope, as well as other mirrors of the same type that were not contaminated.

Paper Details

Date Published: 15 October 2012
PDF: 12 pages
Proc. SPIE 8510, Earth Observing Systems XVII, 85101B (15 October 2012); doi: 10.1117/12.933276
Show Author Affiliations
J. D. Barrie, The Aerospace Corp. (United States)
P. D. Fuqua, The Aerospace Corp. (United States)
M. J. Meshishnek, The Aerospace Corp. (United States)
M. R. Ciofalo, The Aerospace Corp. (United States)
C. T. Chu, The Aerospace Corp. (United States)
J. A. Chaney, The Aerospace Corp. (United States)
R. M. Moision, The Aerospace Corp. (United States)
L. Graziani, SGT, Inc. (United States)

Published in SPIE Proceedings Vol. 8510:
Earth Observing Systems XVII
James J. Butler; Xiaoxiong Xiong; Xingfa Gu, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?