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Proceedings Paper

Technology Assurance For Very Large Scale Integrated (VLSI)/VHSIC Custom Devices
Author(s): Arnold J. Borofsky
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Paper Abstract

Criteria and procedures that provide assurance as to a manufacturer's ability to provide functionally reproducible and reliable devices are desirable prior to user commitment to the design of a custom device. Additions and modifications to current practices are necessary when procurement of small batches of high-density, custom microelectronic devices are anticipated. This paper analyzes the problems that may be encountered with emerging VLSI/VHSIC technologies and describes a method that, if implemented, could minimize costs and adverse schedule impact to the user.

Paper Details

Date Published: 4 August 1982
PDF: 8 pages
Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); doi: 10.1117/12.933163
Show Author Affiliations
Arnold J. Borofsky, The Aerospace Corporation (United States)


Published in SPIE Proceedings Vol. 0319:
Very High Speed Integrated Circuit Technology for Electro-Optic Applications
William S. Chan; John T. Hall, Editor(s)

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