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Proceedings Paper

High Resolution X-Ray Scattering Measurements
Author(s): Martin V. Zombeck; Heinrich Brauninger; Axel Ondrusch; Peter Predehl
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Paper Abstract

The results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 κeV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.

Paper Details

Date Published: 24 March 1982
PDF: 13 pages
Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933152
Show Author Affiliations
Martin V. Zombeck, Harvard/Smithsonian Center for Astrophysics (United States)
Heinrich Brauninger, Max-Planck-Institut fur Physik and Astrophysik (Germany)
Axel Ondrusch, Max-Planck-Institut fur Physik and Astrophysik (Germany)
Peter Predehl, Max-Planck-Institut fur Physik and Astrophysik (Germany)

Published in SPIE Proceedings Vol. 0316:
High Resolution Soft X-Ray Optics
Eberhard Adolf Spiller, Editor(s)

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