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Proceedings Paper

Production And Evaluation Of Supersmooth X-Ray Synchrotron Mirror Surfaces
Author(s): C. A. Wallace; K. Lindsey
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Paper Abstract

The manufacturing tolerances for X-ray mirrors used for synchrotron radiation are demanding, in that departures from the theoretical surface may not exceed a few 1/10 μm, and the small scale roughness should not exceed 1 nm peak to valley. Both large and small scale deviations are measured with contacting probe instruments. X-ray mirrors must be stable and radiation resistant in intense synchrotron beams. Alternatives to silica glass include electroless nickel and silicon carbide. These materials can be finished to yield a small scale roughness of no more than a few 1/10 nm peak to valley.

Paper Details

Date Published: 3 May 1982
PDF: 7 pages
Proc. SPIE 0315, Reflecting Optics for Synchrotron Radiation, (3 May 1982); doi: 10.1117/12.933010
Show Author Affiliations
C. A. Wallace, Astron Developments Ltd. (United Kingdom)
K. Lindsey, National Physical Laboratory (United Kingdom)

Published in SPIE Proceedings Vol. 0315:
Reflecting Optics for Synchrotron Radiation
Malcolm R. Howells, Editor(s)

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