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Proceedings Paper

Spectral Characterization Methodology Of Thin-Film Optical Filters
Author(s): Thomas W. Merritt; John V. Gavin; Charles A. Burke
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Paper Abstract

A review is presented of some of the more common pitfalls encountered in measuring and using thin-film interference filters. Measurement difficulties, including angle-of-incidence effects and the influence of instrument polarization and cone-angle, are described as well as problems such as the "Stierwalt Effect" which create difficulties in usage. The presence of imaginary "leaks" which appear in measurements and true "leaks" which do not show up in spectrophotometer scans (but do appear in your application) is discussed. The authors suggest measurement procedures and application techniques intended to circumvent these problems where possible.

Paper Details

Date Published: 4 March 1982
PDF: 12 pages
Proc. SPIE 0308, Contemporary Infrared Standards and Calibration, (4 March 1982); doi: 10.1117/12.932773
Show Author Affiliations
Thomas W. Merritt, Balzers Optical Group (United States)
John V. Gavin, Balzers Optical Group (United States)
Charles A. Burke, Balzers Optical Group (United States)

Published in SPIE Proceedings Vol. 0308:
Contemporary Infrared Standards and Calibration
Herbert Kaplan; Frederic M. Zweibaum, Editor(s)

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