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Proceedings Paper

Photoacoustic And Diffuse Reflectance Fourier Transform Infrared (FTIR) Spectrometry: Complementary Or Supplementary Techniques?
Author(s): S. Agyare Yeboah; Peter R. Griffiths; K. Krishnan; Donald Kuehl
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Paper Abstract

Measurement of the spectrum of certain types of solid samples has always presented infrared spectroscopists with a problem. Although some solids can be pressed into a KBr disk, ground into a mineral oil mull, contacted with an internal reflection element, or even pressed into a self-supporting wafer, by no means all samples fall into one of these categories. For example, recognizable spectra of chunky polymer samples which are not easily ground or dissolved, and which are too hard to afford good contact with an ATR plate, are always difficult to measure. Similarly the problems of measuring the spectra of species adsorbed on the surface of catalysts and other adsorbents have usually given surface chemists some difficulty. If the sample is pressed into a self-supporting wafer and the transmittance spectrum is measured after the fashion first described by Eischens, scattering at high wavenumber and absorption by the adsorbent (typically below 1200 cm-1 for silica and alumina) severely reduce the signal-to-noise ratio (SNR) of the measured spectrum. Another less commonly recognized problem with this type of sampling technique is that once the wafer is pressed, the surface area available to the adsorbate is considerably reduced.

Paper Details

Date Published: 29 October 1981
PDF: 3 pages
Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); doi: 10.1117/12.932140
Show Author Affiliations
S. Agyare Yeboah, Ohio University (United States)
Peter R. Griffiths, Ohio University (United States)
K. Krishnan, Digilab Division of Bio-Rad (United States)
Donald Kuehl, Digilab Division of Bio-Rad (United States)

Published in SPIE Proceedings Vol. 0289:
1981 Intl Conf on Fourier Transform Infrared Spectroscopy
Hajime Sakai, Editor(s)

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