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Proceedings Paper

Low-Level Losses In Ultraviolet Laser Window Materials
Author(s): David F. Edwards; Ellen Ochoa; Philip Baumeister
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Paper Abstract

The low-level insertion losses have been measured for uv grade CaF2 and MgF2 using the multipass reflectometer. These losses include surface absorption and surface losses as well as bulk absorption. Comparing our data with absorption measured by calorimetric methods indicates that insertion losses are dominated by surface effects and bulk properties play only a minor role.

Paper Details

Date Published: 30 December 1981
PDF: 3 pages
Proc. SPIE 0288, Los Alamos Conf on Optics '81, (30 December 1981); doi: 10.1117/12.932017
Show Author Affiliations
David F. Edwards, University of California (United States)
Ellen Ochoa, University of California (United States)
Philip Baumeister, Optical Coatings Laboratory, Inc., (United States)

Published in SPIE Proceedings Vol. 0288:
Los Alamos Conf on Optics '81
Donald H. Liebenberg, Editor(s)

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