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Proceedings Paper

Assessment Of Contamination In The Shuttle Bay
Author(s): J. A. Jeffery; C. R. Maag; J. W. Seastrom; M. F. Weber
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Paper Abstract

Diffusion of outgassed shuttle bay materials is of concern to payloads especially if optics and sensitive instrumentation are not protected. Contamination can occur which will reduce data collection ability and lifetime of shuttle launched spacecraft. Therefore, prediction and prevention of such contamination is of concern. A diffusion solution is discussed which is capable of making such predictions. Use of a protective cover and/or a purge is also discussed as methods of contamination prevention and their effectiveness is analyzed as a function of cover vent size and flow rate.

Paper Details

Date Published: 19 February 1982
PDF: 13 pages
Proc. SPIE 0287, Shuttle Optical Environment, (19 February 1982); doi: 10.1117/12.932005
Show Author Affiliations
J. A. Jeffery, California Institute of Technology (United States)
C. R. Maag, California Institute of Technology (United States)
J. W. Seastrom, California Institute of Technology (United States)
M. F. Weber, University of Toronto (Canada)


Published in SPIE Proceedings Vol. 0287:
Shuttle Optical Environment
Giovanni G. Fazio; Edgar Miller, Editor(s)

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