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Proceedings Paper

Design Approach To A High-Precision Reflectometer For Component Study Evaluation
Author(s): Cem Gokay; Kevin Harding; John Loomis; Joe Marcheski
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Paper Abstract

High-power lasers require beam directing optics with high damage thresholds. To achieve this, coatings with very high reflectivity and low absorption are being developed by many investigators. This paper describes a reflectometer for measuring these high reflectances to a very high precision. Parameters investigated for this design are source stability, detector limitations, data collection schemes, and the basic optical configuration. The most promising optical configurations investigated include a single-bounce system and a goniometric type double-bounce system. Data collection was best accomplished using a noise-eliminating sample and hold system in conjunction with a gain compensated, AC coupled amplifier referenced to a duplicate system sampling the source output. Conventional lock-in and differential amplifiers were not found acceptable for the high precision sought.

Paper Details

Date Published: 15 September 1981
PDF: 8 pages
Proc. SPIE 0270, High Power Lasers and Applications, (15 September 1981);
Show Author Affiliations
Cem Gokay, University of Dayton Research Institute (United States)
Kevin Harding, University of Dayton Research Institute (United States)
John Loomis, University of Dayton Research Institute (United States)
Joe Marcheski, University of Dayton Research Institute (United States)

Published in SPIE Proceedings Vol. 0270:
High Power Lasers and Applications
Charles C. Tang, Editor(s)

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