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Proceedings Paper

A soft x-ray beam-splitting multilayer optic for the NASA GEMS Bragg Reflection Polarimeter
Author(s): Ryan Allured; Mónica Fernández-Perea; Regina Soufli; Jennifer B. Alameda; Alicia Maxwell; Michael J. Pivovaroff; Eric M. Gullikson; Philip Kaaret
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Paper Abstract

A soft X-ray, beam-splitting, multilayer optic has been developed for the Bragg Reflection Polarimeter on the NASA Gravity and Extreme Magnetism Small Explorer Mission (GEMS). The optic is designed to reflect 0.5 keV X-rays through a 90 degree angle to the BRP detector, and transmit 2-10 keV X-rays to the primary polarimeter. A transmission requirement prevents the use of a thick substrate, so a 2 µm thick polyimide membrane was used. Atomic force microscopy has shown the membrane to possess high spatial frequency roughness less than 0.2 nm rms, permitting adequate X-ray reflectance. A multilayer thin film was especially developed with reflectance and transmission properties that satisfy the BRP requirements and with near-zero stress. Multilayer depositions for prototype reflectors have been performed via magnetron sputtering. Reflectivity and transmission measurements closely match theoretical predictions, both before and after rigorous environmental testing.

Paper Details

Date Published: 19 October 2012
PDF: 12 pages
Proc. SPIE 8502, Advances in X-Ray/EUV Optics and Components VII, 850206 (19 October 2012); doi: 10.1117/12.930093
Show Author Affiliations
Ryan Allured, The Univ. of Iowa (United States)
Mónica Fernández-Perea, Lawrence Livermore National Lab. (United States)
Regina Soufli, Lawrence Livermore National Lab. (United States)
Jennifer B. Alameda, Lawrence Livermore National Lab. (United States)
Alicia Maxwell, The Univ. of Iowa (United States)
Michael J. Pivovaroff, Lawrence Livermore National Lab. (United States)
Eric M. Gullikson, Lawrence Berkeley National Lab. (United States)
Philip Kaaret, The Univ. of Iowa (United States)

Published in SPIE Proceedings Vol. 8502:
Advances in X-Ray/EUV Optics and Components VII
Shunji Goto; Christian Morawe; Ali M. Khounsary, Editor(s)

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