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Proceedings Paper

In situ lifetime testing of organic light emitting diodes
Author(s): C. W. Merkel; M. G. Helander; J. Qiu; Z. H. Lu
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Paper Abstract

A major barrier to commercial adoption of organic light emitting diode (OLED) based devices is their often unacceptably fast rate of degradation. Typically, to estimate device lifetime, electrical parameters such as driving voltage and luminance are periodically measured while constant current is applied to the OLED. Due to the repetitive nature and long timescales involved in lifetime testing, the procedure is an ideal candidate for automation. An automated lifetimetesting system and accompanying software was developed to simultaneously drive multiple OLED devices and collect lifetime parameters while the entire system is under ultra-high vacuum conditions. The system is connected to a larger vacuum chamber so that devices can be synthesized and then analyzed in situ without exposure to atmosphere. The system was developed with the aim of facilitating rapid discovery and understanding of OLED degradation mechanisms.

Paper Details

Date Published: 13 September 2012
PDF: 14 pages
Proc. SPIE 8476, Organic Light Emitting Materials and Devices XVI, 847622 (13 September 2012); doi: 10.1117/12.929978
Show Author Affiliations
C. W. Merkel, Univ. of Toronto (Canada)
M. G. Helander, Univ. of Toronto (Canada)
J. Qiu, Univ. of Toronto (Canada)
Z. H. Lu, Univ. of Toronto (Canada)
Yunnan Univ. (China)


Published in SPIE Proceedings Vol. 8476:
Organic Light Emitting Materials and Devices XVI
Franky So; Chihaya Adachi, Editor(s)

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