Share Email Print

Proceedings Paper

Quantification of charge carrier density in organic light-emitting diodes by time-resolved electroluminescence
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Excessive charge carrier densities in the emission layer of organic light-emitting diodes (OLEDs) can lead to significant quenching by triplet-polaron-annihilation [1] or field-induced quenching [2]. Thus, to increase the efficiency of OLEDs further, a technique for the reliable determination of charge carrier densities in OLEDs is most desirable. Time-resolved spectroscopy is a powerful tool to investigate electronic and excitonic transfer processes [3]. By application of a voltage pulse to a phosphorescent state-of-the-art OLED we find a transient overshoot after voltage turn-off. This has primarily been found in phosphorescent OLEDs and has typically been attributed to delayed recombination of trapped charge carriers [4-7]. In this contribution we investigate charge carrier accumulation within the emission layer (EML) and provide a method to quantify the density of stored electrons.

Paper Details

Date Published: 13 September 2012
PDF: 4 pages
Proc. SPIE 8476, Organic Light Emitting Materials and Devices XVI, 84761I (13 September 2012); doi: 10.1117/12.929586
Show Author Affiliations
Caroline Weichsel, Technische Univ. Dresden (Germany)
Sebastian Reineke, Technische Univ. Dresden (Germany)
Malte C. Gather, Technische Univ. Dresden (Germany)
Karl Leo, Technische Univ. Dresden (Germany)
Björn Lüssem, Technische Univ. Dresden (Germany)

Published in SPIE Proceedings Vol. 8476:
Organic Light Emitting Materials and Devices XVI
Franky So; Chihaya Adachi, Editor(s)

© SPIE. Terms of Use
Back to Top