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Proceedings Paper

Recent progress in four-dimensional phase tomography with grating interferometry
Author(s): Atsushi Momose; Sébastien Harasse; Shunsuke Kibayashi; Margie P. Olbinado; Wataru Yashiro
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Paper Abstract

Four-dimensional X-ray phase tomography has been implemented by a combination of X-ray Talbot interferometry and white synchrotron radiation. While the Fourier-transform method has been used for the measurement of a differential phase image at every projection direction, an improved scan mode based on the fringe-scanning method is demonstrated to improve spatial resolution. The disadvantage of the fringe-scanning method, which requires multiple moiré images, is overcome by proposing a scan mode synchronously combining one-way continuous movements of sample rotation and grating displacement. In addition, the operation of an X-ray Talbot-Lau interferometer with white synchrotron radiation is reported. While an X-ray Talbot interferometer requires a horizontal sample rotation axis because of the condition of spatial coherency, such a horizontal rotation axis is not preferable for tomographic scans especially for soft objects. An X-ray Talbot-Lau interferometer overcomes this problem, allowing a vertical sample rotation axis. Although we encountered a vibration problem with the X-ray Talbot-Lau interferometer probably because of incomplete stage stability, our attempts have basically been successful, and we expect that various samples can be scanned by four-dimensional X-ray phase tomography, revealing dynamical properties in weakly absorbing objects that cannot be accessed by conventional X-ray phase tomography mainly performed for static samples.

Paper Details

Date Published: 17 October 2012
PDF: 7 pages
Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 850603 (17 October 2012); doi: 10.1117/12.929514
Show Author Affiliations
Atsushi Momose, Tohoku Univ (Japan)
Sébastien Harasse, The Univ. of Tokyo (Japan)
Shunsuke Kibayashi, The Univ. of Tokyo (Japan)
Margie P. Olbinado, The Univ. of Tokyo (Japan)
Wataru Yashiro, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 8506:
Developments in X-Ray Tomography VIII
Stuart R. Stock, Editor(s)

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