Share Email Print

Proceedings Paper

Power spectral density integration analysis and its application to large bandwidth, high precision position measurements
Author(s): Martin D. Kochanczyk; Tobias F. Bartsch; Katja M. Taute; Ernst-Ludwig Florin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

High precision position measurements often involve the detection of a laser beam that interacts with various components of an experimental setup. In order to achieve the highest precision, instabilities that contribute to a decrease in precision must be identified and quantified. Instabilities include fluctuations in the laser power, fluctuations in the laser pointing and fluctuations in the phase, as well as vibrating mechanical components that are susceptible to excitations and drift. Instabilities lead to unwanted resonances and band structures in the power spectral density of the detector signals. Typically, the most important instabilities are identified by the magnitude and location of resonances or bands in the power spectral density. However, power spectral density plots can be misleading if the width or shape of a resonance or a band are not correctly accounted for. This is especially true for measurements that span a large bandwidth. Here, we discuss Power Spectral Density Integration Analysis as a more intuitive and accurate method for identifying and quantifying instabilities. Resonances and bands are readily identified as step-like features with heights that correctly represent their contribution to the error in the position measurement.

Paper Details

Date Published: 10 October 2012
PDF: 10 pages
Proc. SPIE 8458, Optical Trapping and Optical Micromanipulation IX, 84580H (10 October 2012); doi: 10.1117/12.929349
Show Author Affiliations
Martin D. Kochanczyk, The Univ. of Texas at Austin (United States)
Tobias F. Bartsch, The Univ. of Texas at Austin (United States)
Katja M. Taute, FOM Institute for Atomic and Molecular Physics (Netherlands)
Ernst-Ludwig Florin, The Univ. of Texas at Austin (United States)

Published in SPIE Proceedings Vol. 8458:
Optical Trapping and Optical Micromanipulation IX
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?